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article · Journal of Computational Chemistry

Substitutional carbon defects in silicon: A quantum mechanical characterization through the infrared and Raman spectra

202011 citationsOpen accessKafr el-Sheikh University

Abstract

The infrared (IR) and Raman spectra of eight substitutional carbon defects in silicon are computed at the quantum mechanical level by using a periodic supercell approach based on hybrid functionals, an all electron Gaussian type basis set and the CRYSTAL code. The single substitutional C <sub>s</sub> case and its combination with a vacancy (C <sub>s</sub> V and C <sub>s</sub> SiV) are considered first. The progressive saturation of the four bonds of a Si atom with C is then examined. The last set of defects consists of a chain of adjacent carbon atoms C <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:msubsup><mml:mrow></mml:mrow> <mml:mi>s</mml:mi> <mml:mi>i</mml:mi></mml:msubsup> </mml:math> , with i = 1-3. The simple substitutional case, C <sub>s</sub> , is the common first member of the three sets. All these defects show important, very characteristic features in their IR spectrum. One or two C related peaks dominate the spectra: at 596 cm<sup>-1</sup> for C <sub>s</sub> (and C <sub>s</sub> SiV, the second neighbor vacancy is not shifting the C <sub>s</sub> peak), at 705 and 716 cm<sup>-1</sup> for C <sub>s</sub> V, at 537 cm<sup>-1</sup> for C <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:msubsup><mml:mrow></mml:mrow> <mml:mi>s</mml:mi> <mml:mn>2</mml:mn></mml:msubsup> </mml:math> and C <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:msubsup><mml:mrow></mml:mrow> <mml:mi>s</mml:mi> <mml:mn>3</mml:mn></mml:msubsup> </mml:math> (with additional peaks at 522, 655 and 689 for the latter only), at 607 and 624 cm<sup>-1</sup> , 601 and 643 cm<sup>-1</sup> , and 629 cm<sup>-1</sup> for SiC <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:msubsup><mml:mrow></mml:mrow> <mml:mi>s</mml:mi> <mml:mn>2</mml:mn></mml:msubsup> </mml:math> , SiC <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:msubsup><mml:mrow></mml:mrow> <mml:mi>s</mml:mi> <mml:mn>3</mml:mn></mml:msubsup> </mml:math> , and SiC <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:msubsup><mml:mrow></mml:mrow> <mml:mi>s</mml:mi> <mml:mn>4</mml:mn></mml:msubsup> </mml:math> , respectively. Comparison with experiment allows to attribute many observed peaks to one of the C substitutional defects. Observed peaks above 720 cm<sup>-1</sup> must be attributed to interstitial C or more complicated defects.

Research topics

  • Silicon and Solar Cell Technologies
  • Silicon Carbide Semiconductor Technologies
  • Silicon Nanostructures and Photoluminescence

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DOI: 10.1002/jcc.26206

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