article · Matter
Standard solar cell assessment relies on photocurrent density-voltage curves, which only measure total performance across an entire device. A newly derived method uses voltage-dependent photoluminescence microscopy to produce spatially resolved photocurrent images based on fundamental principles. The technique was tested on both III-V and perovskite solar cells to evaluate its capabilities and constraints. It provides real-time, microscopically resolved local performance curves, steady-state short-circuit current, and transient effects. Additionally, it reveals local charge extraction efficiency and interfacial recombination. This capability allows researchers to pinpoint areas with poor charge extraction and connect these local defects to specific processing conditions. Combining luminescence microscopy with potentiostatic measurements provides a valuable approach for analysing performance losses and guiding the optimisation of photovoltaic devices.
Standard testing methods only measure the total power output of a solar cell, concealing local defects. By imaging performance variations at a microscopic scale, this diagnostic technique helps developers pinpoint exactly where and why energy is lost. This can lead to better fabrication processes and more efficient photovoltaic technologies.
The method serves as a characterisation tool for photovoltaic researchers and manufacturers seeking to identify local defects and refine manufacturing conditions. Demonstrated on III-V and perovskite devices, the approach is at an applied laboratory stage rather than an integrated commercial tool, but it offers a practical pathway for quality control and process optimisation in solar cell development.
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The photocurrent density-voltage (J(V)) curve is the fundamental characteristic to assess opto-electronic devices, in particular solar cells. However, it only yields information on the performance integrated over the entire active device area. Here, a method to determine spatially resolved photocurrent images by voltage-dependent photoluminescence microscopy is derived from basic principles. The opportunities and limitations of the approach are studied by the investigation of III-V and perovskite solar cells. This approach allows the real-time assessment of the microscopically resolved local J(V) curve and the steady-state Jsc as well as transient effects. In addition, the measurement contains information on local charge extraction and interfacial recombination. This facilitates the identification of regions of non-ideal charge extraction and enables linking these to the processing conditions. The proposed technique highlights that, combined with potentiostatic measurements, luminescence microscopy can be a powerful tool for the assessment of performance losses and the improvement of solar cells.
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DOI: 10.1016/j.matt.2022.05.024
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