article · Measurement

Integration of artificial intelligence with a customized Four-Probe station for <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si18.svg"><mml:mrow><mml:mrow><mml:mi mathvariant="bold-italic">I</mml:mi></mml:mrow><mml:mo linebreak="badbreak" linebreakstyle="after">-</mml:mo><mml:mrow><mml:mi mathvariant="bold-italic">V</mml:mi></mml:mrow></mml:mrow></mml:math> characteristic classification and prediction

20245 citationsBritish University in Egypt

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Research topics

Integrated Circuits and Semiconductor Failure Analysis
VLSI and Analog Circuit Testing
Semiconductor materials and interfaces

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DOI: 10.1016/j.measurement.2024.115676

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