Exploration of the Magnetic Properties of ZrCo:Co Bilayer Films: Effects of the Thickness of the Co Layer on the Anisotropy and Magnetic Interaction Parameters

Abstract

The analysis of ZrCo:Co films with varying Co layer thicknesses reveals distinctive magnetic properties and behaviors. Despite significant roughness, the films exhibit uniform surfaces and complete crystallization at the nanoscale. Magnetic studies show positive remanence anisotropy, decreased coercivity Hc and remanent magnetization Mr with increasing film thickness, along with a linear correlation between thickness and surface roughness. Exchange interactions between grains and layers influence magnetic properties. Ferromagnetic resonance analysis demonstrates a direct correlation between film thickness and magnetization orientation preference, notably at δ Co = 200 nm. These findings underscore the critical role of film thickness in determining microstructural and magnetic properties, offering insights for magnetic device and nanotechnology applications. Understanding these relationships may lead to thickness‐tunable magnetic materials. This study uniquely explores ZrCo:Co films, delving into how their magnetic properties vary with Co layer thickness, revealing novel magnetic behaviors.